DocumentCode :
1389862
Title :
The electrical DC resistance scale from 100 kΩ to 1 TΩ at IEN
Author :
Galliana, Flavio ; Boella, Giorgio
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
Volume :
49
Issue :
5
fYear :
2000
fDate :
10/1/2000 12:00:00 AM
Firstpage :
959
Lastpage :
963
Abstract :
At IEN, the scale of resistance in the field 100 kΩ to 1 TΩ has been revised through the characterization of a series of new standard resistors. The preliminary study, realization and characterization of four measurement methods are also described in this paper. The complete description of a new automatic method for the calibration of high-value standard resistors, particularly in the range 10 MΩ-1 TΩ, and their measurement at different voltage levels are also reported. It makes use of a programmable high-stability dc voltage calibrator which supplies a voltage Vout to the series of an unknown resistor Rx, and of a standard resistor Rs. A high-precision programmable multimeter (DMM) is used to measure Vout and the voltage Vs across the standard resistor, from which the value of the current I is determined. The value of Rx is given by Rx=(Vout-Vs)/I. The best measurement capabilities of IEN using these four measurement methods span from 0.7×10-6 for the calibration of the 100 kΩ standard resistor at the measurement voltage of 10 V, to 7.1×10-4 for the calibration of 1 TΩ standard resistor at the measurement voltage of 500 V.
Keywords :
bridge instruments; calibration; computerised instrumentation; digital multimeters; electric resistance measurement; measurement standards; resistors; 10 Mohm to 1 Tohm; 10 V; 100 kΩ standard resistor; 100 kΩ to 1 TΩ; 100 kohm to 1 Tohm; 500 V; IEN; Wheatstone bridge; automatic method; calibration; dc voltage calibrator; electrical DC resistance scale; measurement voltage; programmable multimeter; stability; standard resistors; Calibration; Current measurement; Electric resistance; Electrical resistance measurement; Measurement standards; Particle measurements; Resistors; Stability; Temperature measurement; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.872914
Filename :
872914
Link To Document :
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