Title :
Trainable Convolution Filters and Their Application to Face Recognition
Author :
Kumar, Ritwik ; Banerjee, Arunava ; Vemuri, Baba C. ; Pfister, Hanspeter
Author_Institution :
IBM Res. - Almaden, San Jose, CA, USA
fDate :
7/1/2012 12:00:00 AM
Abstract :
In this paper, we present a novel image classification system that is built around a core of trainable filter ensembles that we call Volterra kernel classifiers. Our system treats images as a collection of possibly overlapping patches and is composed of three components: (1) A scheme for a single patch classification that seeks a smooth, possibly nonlinear, functional mapping of the patches into a range space, where patches of the same class are close to one another, while patches from different classes are far apart-in the L_2 sense. This mapping is accomplished using trainable convolution filters (or Volterra kernels) where the convolution kernel can be of any shape or order. (2) Given a corpus of Volterra classifiers with various kernel orders and shapes for each patch, a boosting scheme for automatically selecting the best weighted combination of the classifiers to achieve higher per-patch classification rate. (3) A scheme for aggregating the classification information obtained for each patch via voting for the parent image classification. We demonstrate the effectiveness of the proposed technique using face recognition as an application area and provide extensive experiments on the Yale, CMU PIE, Extended Yale B, Multi-PIE, and MERL Dome benchmark face data sets. We call the Volterra kernel classifiers applied to face recognition Volterrafaces. We show that our technique, which falls into the broad class of embedding-based face image discrimination methods, consistently outperforms various state-of-the-art methods in the same category.
Keywords :
convolution; embedded systems; face recognition; filtering theory; image classification; nonlinear filters; CMU PIE; L2 sense; MERL dome benchmark face data sets; Volterra kernel classifiers; Volterrafaces; boosting scheme; classification information aggregation; embedding-based face image discrimination methods; extended Yale B; face recognition; functional mapping; image classification; image classification system; multiPIE; overlapping patches; per-patch classification rate; range space; single patch classification; state-of-the-art methods; trainable convolution filters; Boosting; Convolution; Face recognition; Feature extraction; Kernel; Shape; Training; Face recognition; Fisher´s linear discriminant; Volterra kernels; boosting.; convolution; filtering classifier;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.225