Title :
CPMC: Automatic Object Segmentation Using Constrained Parametric Min-Cuts
Author :
Carreira, João ; Sminchisescu, Cristian
Author_Institution :
Comput. Vision & Machine Learning Group, Univ. of Bonn, Bonn, Germany
fDate :
7/1/2012 12:00:00 AM
Abstract :
We present a novel framework to generate and rank plausible hypotheses for the spatial extent of objects in images using bottom-up computational processes and mid-level selection cues. The object hypotheses are represented as figure-ground segmentations, and are extracted automatically, without prior knowledge of the properties of individual object classes, by solving a sequence of Constrained Parametric Min-Cut problems (CPMC) on a regular image grid. In a subsequent step, we learn to rank the corresponding segments by training a continuous model to predict how likely they are to exhibit real-world regularities (expressed as putative overlap with ground truth) based on their mid-level region properties, then diversify the estimated overlap score using maximum marginal relevance measures. We show that this algorithm significantly outperforms the state of the art for low-level segmentation in the VOC 2009 and 2010 data sets. In our companion papers [1], [2], we show that the algorithm can be used, successfully, in a segmentation-based visual object category recognition pipeline. This architecture ranked first in the VOC2009 and VOC2010 image segmentation and labeling challenges.
Keywords :
feature extraction; image segmentation; CPMC; automatic object segmentation; bottom-up computational processes; constrained parametric min-cut problems; figure-ground segmentations; image grid; image segmentation; maximum marginal relevance; mid-level selection cues; objects spatial extent; segmentation-based visual object category recognition pipeline; Detectors; Image color analysis; Image edge detection; Image segmentation; Object recognition; Object segmentation; Shape; Image segmentation; figure-ground segmentation; learning.;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.231