• DocumentCode
    1390063
  • Title

    Comparative study of silicon detectors

  • Author

    Allier, C.P. ; Valk, H. ; Huizenga, J. ; Bom, V.R. ; Hollander, R.W. ; van Eijk, C.W.E.

  • Author_Institution
    Interfacultair Reactor Inst., Delft Univ. of Technol., Netherlands
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    576
  • Lastpage
    580
  • Abstract
    We studied three different types of silicon sensors: PIN diodes, circular drift detectors, both made at the Delft University of Technology (DUT), and Hamamatsu S5345 avalanche photodiodes. Measurements have been carried out in the same optimized experimental setup, both at room temperature and at low temperatures. Comparison is made for direct X-ray detection and CsI:Tl scintillation light readout
  • Keywords
    X-ray detection; avalanche photodiodes; p-i-n diodes; silicon radiation detectors; 293 K; CsI:Tl; Hamamatsu S5345 avalanche photodiode; PIN diodes; Si; Si detectors; X-ray detection; circular drift detectors; low temperature; room temperature; Avalanche photodiodes; Capacitance; Energy resolution; Leakage current; Noise shaping; Preamplifiers; Silicon; Solid scintillation detectors; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.682451
  • Filename
    682451