Title :
Complementary Germanium Electron–Hole Bilayer Tunnel FET for Sub-0.5-V Operation
Author :
Lattanzio, Livio ; De Michielis, Luca ; Ionescu, Adrian M.
Author_Institution :
Nanoelectronic Devices Lab. (Nanolab), Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
Abstract :
In this letter, we present a novel device, the germanium electron-hole (EH) bilayer tunnel field-effect transistor, which exploits carrier tunneling through a bias-induced EH bilayer. The proposed architecture provides a quasi-ideal alignment between the tunneling path and the electric field controlled by the gate. The device principle and performances are studied by 2-D numerical simulations. This device allows interesting features in terms of low operating voltage (<; 0.5 V), due to its super-steep subthreshold slope (SSAVG ~ 13 mV/dec over six decades of current), ION/IOFF ratio of ~ 109, and drive current of ION ~ 10 μA/μm at VDD = 0.5 V. The same structure with symmetric voltages can be used to achieve a p-type device with ION and IOFF levels comparable to the n-type, which enables a straightforward implementation of complementary logic that could theoretically reach a maximum operating frequency of 1.39 GHz when VDD = 0.25 V.
Keywords :
UHF field effect transistors; elemental semiconductors; germanium; logic devices; microwave field effect transistors; semiconductor device models; tunnel transistors; 2D numerical simulations; EHBTFET; Ge; bias-induced electron-hole bilayer; carrier tunneling; complementary germanium electron-hole bilayer tunnel FET; complementary logic; drive current; frequency 1.39 GHz; n-type device; on-off ratio; operating frequency; subthreshold slope; symmetric p-type device; tunnel field effect transistor; voltage 0.25 V; voltage 0.5 V; Delay; FETs; Germanium; Logic gates; Performance evaluation; Tunneling; Band-to-band tunneling (BTBT); electron–hole (EH) bilayer; field-effect transistor (FET); germanium; subthreshold slope; tunnel FET (TFET);
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2011.2175898