Title :
The effect of tip type and scan height on magnetic domain images obtained by MFM
Author :
Al-Khafaji, Mohammed A. ; Rainforth, W. Mark ; Gibbs, Mike R J ; Bishop, John E L ; Davies, Hywel A.
Author_Institution :
Sheffield Centre for Adv. Magnetic Mater. & Devices, Sheffield Univ., UK
fDate :
9/1/1996 12:00:00 AM
Abstract :
In the last few years there has been a considerable expansion in the application of Magnetic Force Microscopy (MFM). MFM images the stray field from the sample, offers excellent lateral resolution (~10 nm) and requires minimal sample preparation. The interaction between the stray field from the sample and from the sensing tip depends on the shape of the tip, the composition and thickness of its coating and the scan height above the sample. The effects of tip type and scan height on the MFM image are reported for a Nd-Fe-B specimen composed of a few large crystallites of similar orientation. The observed structures of order ⩾1 μm are discussed in the context of established models for the domain structure of strongly uniaxial materials. Unexpected fine magnetic structure ≈25 nm is reported
Keywords :
boron alloys; iron alloys; magnetic domains; magnetic force microscopy; microscopy; neodymium alloys; MFM imaging; Nd-Fe-B; Nd-Fe-B crystallites; lateral resolution; magnetic domains; magnetic force microscopy; magnetic structure; scan height; stray field; tip type; uniaxial material; Coatings; Context modeling; Crystalline materials; Crystallization; Image resolution; Magnetic domains; Magnetic force microscopy; Magnetic forces; Magnetic materials; Shape;
Journal_Title :
Magnetics, IEEE Transactions on
