The effect of tip type and scan height on magnetic domain images obtained by MFM

Author

Al-Khafaji, Mohammed A. ; Rainforth, W. Mark ; Gibbs, Mike R J ; Bishop, John E L ; Davies, Hywel A.

Author_Institution

Sheffield Centre for Adv. Magnetic Mater. & Devices, Sheffield Univ., UK

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

4138

Lastpage

4140

Abstract

In the last few years there has been a considerable expansion in the application of Magnetic Force Microscopy (MFM). MFM images the stray field from the sample, offers excellent lateral resolution (~10 nm) and requires minimal sample preparation. The interaction between the stray field from the sample and from the sensing tip depends on the shape of the tip, the composition and thickness of its coating and the scan height above the sample. The effects of tip type and scan height on the MFM image are reported for a Nd-Fe-B specimen composed of a few large crystallites of similar orientation. The observed structures of order ⩾1 μm are discussed in the context of established models for the domain structure of strongly uniaxial materials. Unexpected fine magnetic structure ≈25 nm is reported

Keywords

boron alloys; iron alloys; magnetic domains; magnetic force microscopy; microscopy; neodymium alloys; MFM imaging; Nd-Fe-B; Nd-Fe-B crystallites; lateral resolution; magnetic domains; magnetic force microscopy; magnetic structure; scan height; stray field; tip type; uniaxial material; Coatings; Context modeling; Crystalline materials; Crystallization; Image resolution; Magnetic domains; Magnetic force microscopy; Magnetic forces; Magnetic materials; Shape;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539319

Filename

539319