• DocumentCode
    1390241
  • Title

    Domed and Released Thin-Film Construct—An Approach for Material Characterization and Compliant Interconnects

  • Author

    Ostrowicki, Gregory T. ; Fritz, Nathan T. ; Okereke, Raphael I. ; Kohl, Paul A. ; Sitaraman, Suresh K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    12
  • Issue
    1
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    15
  • Lastpage
    23
  • Abstract
    An approach for microfabricating precisely defined spherical 3-D domes through a simple low-temperature polymer reflow process was developed. Release of a thin metal film patterned over the domed structure was accomplished by the removal of the underlying polymer using two different methods: dry thermal decomposition and wet supercritical release. The domed shape impacted the effect of stiction during the release step and assisted in the release of large millimeter-size film geometries. The dome and release procedures were used to fabricate an experimental test specimen that functions as either a tensile or interfacial fracture test for thin films on rigid substrates. Other potential applications of the domed metal structures such as compliant electrical interconnects are discussed.
  • Keywords
    interconnections; microfabrication; micromechanical devices; pyrolysis; thin films; compliant electrical interconnects; compliant interconnects; domed metal structures; domed-thin-film construct; dry-thermal decomposition; experimental test specimen; interfacial fracture test; low-temperature polymer reflow process; material characterization; microfabrication; millimeter-size film geometries; polymer removal; release step; released-thin-film construct; spherical 3D domes; stiction effect; tensile test; thin-metal film; wet-supercritical release; Copper; Fabrication; Films; Polymers; Strips; Compliant interconnects; MEMS; delamination; dome; reflow; stiction; tensile test; thin film;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2011.2175927
  • Filename
    6095614