• DocumentCode
    1390265
  • Title

    Germanium orthogonal strip detectors with amorphous-semiconductor contacts

  • Author

    Luke, P.N. ; Amman, M. ; Phlips, B.F. ; Johnson, W.N. ; Kroege, R.A.

  • Author_Institution
    Lawrence Berkeley Nat. Lab., California Univ., Berkeley, CA, USA
  • Volume
    47
  • Issue
    4
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    1360
  • Lastpage
    1363
  • Abstract
    Germanium orthogonal strip detectors have been produced using amorphous-semiconductor contacts. The amorphous-semiconductor contact fabrication process is relatively simple, and it is capable of producing fine-pitched electrode structures. The bipolar blocking behavior of the amorphous-semiconductor contact permits its use on both sides of a detector, replacing conventional B ion implanted and Li diffused contacts. A 5×5 orthogonal strip detector has been produced using this technique. Experimental results from this detector are presented
  • Keywords
    amorphous semiconductors; germanium radiation detectors; Ge; Ge orthogonal strip detectors; amorphous-semiconductor contact fabrication process; amorphous-semiconductor contacts; bipolar blocking behavior; fine-pitched electrode structures; Amorphous materials; Contacts; Detectors; Electrodes; Energy resolution; Fabrication; Germanium; Laboratories; Spatial resolution; Strips;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.872978
  • Filename
    872978