DocumentCode
139038
Title
A model for generating Surface EMG signal of m. Tibialis Anterior
Author
Siddiqi, Ariba ; Kumar, Dinesh ; Arjunan, Sridhar P.
Author_Institution
Biosignals Lab., R. Melbourne Inst. of Technol. (RMIT) Univ., Melbourne, VIC, Australia
fYear
2014
fDate
26-30 Aug. 2014
Firstpage
106
Lastpage
109
Abstract
A model that simulates surface electromyogram (sEMG) signal of m. Tibialis Anterior has been developed and tested. This has a firing rate equation that is based on experimental findings. It also has a recruitment threshold that is based on observed statistical distribution. Importantly, it has considered both, slow and fast type which has been distinguished based on their conduction velocity. This model has assumed that the deeper unipennate half of the muscle does not contribute significantly to the potential induced on the surface of the muscle and has approximated the muscle to have parallel structure. The model was validated by comparing the simulated and the experimental sEMG signal recordings. Experiments were conducted on eight subjects who performed isometric dorsiflexion at 10, 20, 30, 50, 75, and 100% maximal voluntary contraction. Normalized root mean square and median frequency of the experimental and simulated EMG signal were computed and the slopes of the linearity with the force were statistically analyzed. The gradients were found to be similar (p>0.05) for both experimental and simulated sEMG signal, validating the proposed model.
Keywords
electromyography; medical signal processing; statistical distributions; conduction velocity; firing rate equation; isometric dorsiflexion; m.Tibialis Anterior; median frequency; normalized root mean square frequency; statistical distribution; surface EMG signal; surface electromyogram signal; voluntary contraction; Computational modeling; Electric potential; Electromyography; Firing; Mathematical model; Muscles; Recruitment;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2014.6943540
Filename
6943540
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