TGLD: a 16-channel charge readout chip for the PHENIX pad chamber detector subsystem at RHIC

Author

Bryan, W.L. ; Jagadish, U. ; Britton, C.L. ; Frank, S.S. ; Ericson, M.N. ; Simpson, M.L. ; Young, G.R. ; Clonts, L.G. ; Smith, R.S. ; Oskarsson, Anders ; Mark, Tommy ; Obrien, Ed ; Greene, Vicki

Author_Institution

Oak Ridge Nat. Lab., TN, USA

Volume

45

Issue

3

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

754

Lastpage

757

Abstract

This paper describes TGLD, a charge readout chip for the PHENIX Pad Chamber (PC) subsystem at Brookhaven National Laboratory´s Relativistic Heavy Ion Collider (RHIC) in Upton, NY. Due to the PC´s high channel density, the TGLD and associated circuitry operate within the active detector region as permanent, zero access components, with remote set-up and test during collider operation. The TGLD design accommodates varying pad capacitance and charge gain for three detector subassemblies that detect particles at three different distances from the PHENIX collision vertex. The design also provides adjustable discrimination thresholds from MIP/10 to 2 MIP (Minimum Ionizing Particle). Three TGLD chips operate with a complimentary digital memory unit (DMU) to form 48 channel low power, low mass, readout cards. Partitioning of readout electronics and address control for robust remote operation are discussed. Component and system test results are also reported

Keywords

detector circuits; nuclear electronics; 16-channel charge readout chip; 48 channel low power low mass readout cards; DMU; Minimum Ionizing Particle; PHENIX collision vertex; PHENIX pad chamber detector subsystem; RHIC; Relativistic Heavy Ion Collider; TGLD; active detector region; charge gain; collider operation; detector subassemblies; digital memory unit; discrimination thresholds; high channel density; pad capacitance; particle detection; remote set-up; robust remote operation; zero access components; Atherosclerosis; Capacitance; Capacitors; Circuit testing; Delay; Detectors; Electronic equipment testing; Energy measurement; Laboratories; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.682630

Filename

682630