DocumentCode :
1390519
Title :
TGLD: a 16-channel charge readout chip for the PHENIX pad chamber detector subsystem at RHIC
Author :
Bryan, W.L. ; Jagadish, U. ; Britton, C.L. ; Frank, S.S. ; Ericson, M.N. ; Simpson, M.L. ; Young, G.R. ; Clonts, L.G. ; Smith, R.S. ; Oskarsson, Anders ; Mark, Tommy ; Obrien, Ed ; Greene, Vicki
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
Volume :
45
Issue :
3
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
754
Lastpage :
757
Abstract :
This paper describes TGLD, a charge readout chip for the PHENIX Pad Chamber (PC) subsystem at Brookhaven National Laboratory´s Relativistic Heavy Ion Collider (RHIC) in Upton, NY. Due to the PC´s high channel density, the TGLD and associated circuitry operate within the active detector region as permanent, zero access components, with remote set-up and test during collider operation. The TGLD design accommodates varying pad capacitance and charge gain for three detector subassemblies that detect particles at three different distances from the PHENIX collision vertex. The design also provides adjustable discrimination thresholds from MIP/10 to 2 MIP (Minimum Ionizing Particle). Three TGLD chips operate with a complimentary digital memory unit (DMU) to form 48 channel low power, low mass, readout cards. Partitioning of readout electronics and address control for robust remote operation are discussed. Component and system test results are also reported
Keywords :
detector circuits; nuclear electronics; 16-channel charge readout chip; 48 channel low power low mass readout cards; DMU; Minimum Ionizing Particle; PHENIX collision vertex; PHENIX pad chamber detector subsystem; RHIC; Relativistic Heavy Ion Collider; TGLD; active detector region; charge gain; collider operation; detector subassemblies; digital memory unit; discrimination thresholds; high channel density; pad capacitance; particle detection; remote set-up; robust remote operation; zero access components; Atherosclerosis; Capacitance; Capacitors; Circuit testing; Delay; Detectors; Electronic equipment testing; Energy measurement; Laboratories; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.682630
Filename :
682630
Link To Document :
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