DocumentCode :
139054
Title :
Development of an electro-optically tuned optical coherence tomography system for imaging dental lesions
Author :
Damodaran, Vani ; Vasa, Nilesh J.
Author_Institution :
Indian Inst. of Technol. Madras, Chennai, India
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
170
Lastpage :
173
Abstract :
A conventional optical coherence tomography (OCT) system was set up in-house to image early dental caries, identify gap formation in the bonding interface for restoration and secondary caries. Two-dimensional images of tooth samples was obtained and dental defect were identified. A novel electro-optic tuning system is proposed in order to improve scanning speed and to perform noiseless imaging. Preliminary studies were conducted with two crystals namely, LiNbO3 (Lithium Niobate) and KTP (Potassium Titanyl Phosphate) using a SLED source for OCT system and the simulated and experimental results were found to be qualitatively similar. The tuning range for LiNbO3 and KTP was found to be in the order of few micrometers whereas KTN (Potassium Tantalate Niobate) using the quadratic electro-optic effect is expected to show scanning range of tens of micrometers. KTN based hybrid scanning for dental caries imaging is also planned.
Keywords :
biomedical optical imaging; dentistry; electro-optical effects; image denoising; medical image processing; optical tomography; potassium compounds; tantalum compounds; KTP; KTaNbO3; LiNbO3; OCT system; SLED source; bonding interface; dental caries; dental defect; dental lesions imaging; electro-optically tuned optical coherence tomography system; lithium niobate; noiseless imaging; potassium tantalate niobate; potassium titanyl phosphate; quadratic electro-optic effect; restoration; scanning speed; secondary caries; tooth samples; two-dimensional images; Bonding; Coherence; Dentistry; Filling; Image restoration; Optical refraction; Optical variables control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6943556
Filename :
6943556
Link To Document :
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