• DocumentCode
    139063
  • Title

    A projection selection method to improve image quality in optical projection tomography

  • Author

    Jin Guo ; Yujie Yang ; Di Dong ; Liangliang Shi ; Hui Hui ; Min Xu ; Jie Tian ; Xia Liu

  • Author_Institution
    Sch. of Autom., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    Optical projection tomography (OPT) is a very important imaging tool for a mesoscopic-scale. It can provide three dimensional (3D) transmission and emission imaging. However, high-resolution OPT is limited in depth of field (DOF) due to a high numerical aperture, which causes a poor performance of OPT in imaging large samples. Moreover, it is difficult to tune the focus plane (FP) to a fixed position where OPT always has the best image quality in different directions. To address these problems, we developed a projection selection method to improve DOF in OPT. In each direction, our method automatically selects the best projection from several projections with different FP. Then, we use a series of selected projections for 3D reconstruction. The experimental results demonstrate that our method can improve the image quality comparing to a fixed FP. Moreover, our method is flexible to be used in other OPT setups by adding a linear stage.
  • Keywords
    biomedical optical imaging; image reconstruction; image resolution; medical image processing; optical tomography; 3D reconstruction; depth-of-field; emission imaging; focus plane; high numerical aperture; high-resolution OPT; image quality; linear stage; optical projection tomography; projection selection method; three dimensional transmission imaging; Adaptive optics; Biomedical optical imaging; Optical imaging; Optimized production technology; Three-dimensional displays; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6943565
  • Filename
    6943565