Title :
A scintillation detector signal processing technique with active pileup prevention for extending scintillation count rates
Author :
Wong, W.-H. ; Li, H.
Author_Institution :
M.D. Anderson Cancer Center, Texas Univ., Houston, TX, USA
fDate :
6/1/1998 12:00:00 AM
Abstract :
A new method for processing signals from scintillation detectors is proposed for very high count-rate situations where multiple-event pileups are the norm. This method is designed to sort out and recover every impinging event from multiple-event pileups while maximizing the collection of scintillation signal for every event to achieve optimal accuracy in determining the energy of the event. For every detected event, this method cancels the remnant signals from previous events, and excludes the pileup of signals from following events. With this technique, pileup events can be recovered and the energy of every recovered event can be optimally measured despite multiple pileups. A prototype circuit demonstrated that the maximum count rates have been increased by more than 10 times, comparing to the standard pulse-shaping method, while the energy resolution is as good as that of the pulse shaping (or the fixed integration) method at normal count rates. At 2×106 events/sec for NaI(Tl), the true counts acquired are 3 times more than the delay-line clipping method (commonly used in fast processing designs) due to events recovered from pileups. Pulse-height spectra up to 3.5×106 events/sec have been studied
Keywords :
scintillation counters; signal processing; active pileup prevention; delay-line clipping method; energy resolution; high count-rate; maximum count rates; multiple-event pileups; pulse shaping; pulse-height spectra; scintillation count rates; scintillation detector; signal processing; Design methodology; Energy measurement; Event detection; Integrated circuit measurements; Pulse shaping methods; Scintillation counters; Signal design; Signal detection; Signal processing; Solid scintillation detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on