Title :
Phase Frequency Detector With Minimal Blind Zone for Fast Frequency Acquisition
Author :
Chen, Wu-Hsin ; Inerowicz, Maciej E. ; Jung, Byunghoo
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Blind zone in a phase-frequency detector (PFD) reduces the input detection range and aggravates cycle slips. This brief analyzes the blind zone in latch-based PFDs and proposes a technique that removes the blind zone caused by the precharge time of the internal nodes. With the proposed technique, the PFD achieves a small blind zone close to the limit imposed by process-voltage-temperature variations. The comparison between the proposed design and previous works is presented. Fabricated in a 130-nm CMOS technology, the measured blind zone is 61 ps, which is smaller than that of the existing topologies by almost 100 ps.
Keywords :
CMOS integrated circuits; phase detectors; phase locked loops; signal detection; 130-nm CMOS technology; fast frequency acquisition; internal nodes; latch-based PFD; phase frequency detector; process-voltage-temperature variations; size 130 nm; time 61 ps; with minimal blind zone; CMOS integrated circuits; Charge pumps; Delay; Phase frequency detector; Phase locked loops; Transistors; Blind zone; cycle slips; phase-frequency detector (PFD); variation;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2010.2087951
