DocumentCode :
1390813
Title :
Reminiscences of the VLSI Revolution: How a Series of Failures Triggered a Paradigm Shift in Digital Design
Author :
Conway, Lynn
Author_Institution :
University of Michigan, Ann Arbor, MI 48109 USA
Volume :
4
Issue :
4
fYear :
2012
Firstpage :
8
Lastpage :
31
Abstract :
Innovations in science and engineering have excited me for a lifetime, as they have for many friends and colleagues. Unfortunately, our wider culture often imagines the engineering life to be one of tedium and technical drudgery, seldom witnessing the joys of such creativity.
Keywords :
Research and development; Technological innovation; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits Magazine, IEEE
Publisher :
ieee
ISSN :
1943-0582
Type :
jour
DOI :
10.1109/MSSC.2012.2215752
Filename :
6393023
Link To Document :
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