Title :
“Covering”: How We Missed the Inside-Story of the VLSI Revolution
Author_Institution :
Columbia University, New York USA
Abstract :
I´m delighted to comment on Lynn Conway´s outstanding piece “Reminiscences of the VLSI Revolution: How a series of failures triggered a paradigm shift in digital design.” What we often forget in engineering and science is that innovation and technological progress happen because of actions of people, people who have personalities, lives, and life stories that influence them and are influenced by those around them. Lynn´s story provides a case in point.
Journal_Title :
Solid-State Circuits Magazine, IEEE
DOI :
10.1109/MSSC.2012.2215757