DocumentCode :
1390846
Title :
Flicker Noise Effects in Noise Adding Radiometers
Author :
Lynch, Jonathan J. ; Nagele, Robert G.
Author_Institution :
HRL Labs. LLC, Malibu, CA, USA
Volume :
59
Issue :
1
fYear :
2011
Firstpage :
196
Lastpage :
205
Abstract :
This paper presents an analysis of noise adding radiometers that includes the effects of flicker, or 1/f, noise which often limits radiometer performance. The 1/f noise processes within the detector are affected by the modulation of the detector voltage as a result of the injected noise power and cause the overall 1/f noise to increase. The functional dependence of the 1/f noise parameters on degree of source modulation is determined experimentally. The primary result of this paper is a concise mathematical formula for the noise equivalent temperature difference of a noise adding radiometer explicitly showing the dependences on the radiometer parameters, as well as detector voltages when the source is on and off. From this formula, we derive the optimum on and off voltage ratio that maximizes sensitivity.
Keywords :
flicker noise; modulation; radiometers; detector voltages; flicker noise effects; functional dependence; injected noise power; noise adding radiometers; noise equivalent temperature difference; noise parameters; noise process; radiometer parameters; radiometer performance; source modulation; Bandwidth; Detectors; Logic gates; Modulation; Noise; Radio frequency; Radiometers; Flicker noise; noise adding radiometer; passive millimeter-wave imaging;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2010.2090709
Filename :
5648471
Link To Document :
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