DocumentCode
1390846
Title
Flicker Noise Effects in Noise Adding Radiometers
Author
Lynch, Jonathan J. ; Nagele, Robert G.
Author_Institution
HRL Labs. LLC, Malibu, CA, USA
Volume
59
Issue
1
fYear
2011
Firstpage
196
Lastpage
205
Abstract
This paper presents an analysis of noise adding radiometers that includes the effects of flicker, or 1/f, noise which often limits radiometer performance. The 1/f noise processes within the detector are affected by the modulation of the detector voltage as a result of the injected noise power and cause the overall 1/f noise to increase. The functional dependence of the 1/f noise parameters on degree of source modulation is determined experimentally. The primary result of this paper is a concise mathematical formula for the noise equivalent temperature difference of a noise adding radiometer explicitly showing the dependences on the radiometer parameters, as well as detector voltages when the source is on and off. From this formula, we derive the optimum on and off voltage ratio that maximizes sensitivity.
Keywords
flicker noise; modulation; radiometers; detector voltages; flicker noise effects; functional dependence; injected noise power; noise adding radiometers; noise equivalent temperature difference; noise parameters; noise process; radiometer parameters; radiometer performance; source modulation; Bandwidth; Detectors; Logic gates; Modulation; Noise; Radio frequency; Radiometers; Flicker noise; noise adding radiometer; passive millimeter-wave imaging;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2010.2090709
Filename
5648471
Link To Document