• DocumentCode
    1390846
  • Title

    Flicker Noise Effects in Noise Adding Radiometers

  • Author

    Lynch, Jonathan J. ; Nagele, Robert G.

  • Author_Institution
    HRL Labs. LLC, Malibu, CA, USA
  • Volume
    59
  • Issue
    1
  • fYear
    2011
  • Firstpage
    196
  • Lastpage
    205
  • Abstract
    This paper presents an analysis of noise adding radiometers that includes the effects of flicker, or 1/f, noise which often limits radiometer performance. The 1/f noise processes within the detector are affected by the modulation of the detector voltage as a result of the injected noise power and cause the overall 1/f noise to increase. The functional dependence of the 1/f noise parameters on degree of source modulation is determined experimentally. The primary result of this paper is a concise mathematical formula for the noise equivalent temperature difference of a noise adding radiometer explicitly showing the dependences on the radiometer parameters, as well as detector voltages when the source is on and off. From this formula, we derive the optimum on and off voltage ratio that maximizes sensitivity.
  • Keywords
    flicker noise; modulation; radiometers; detector voltages; flicker noise effects; functional dependence; injected noise power; noise adding radiometers; noise equivalent temperature difference; noise parameters; noise process; radiometer parameters; radiometer performance; source modulation; Bandwidth; Detectors; Logic gates; Modulation; Noise; Radio frequency; Radiometers; Flicker noise; noise adding radiometer; passive millimeter-wave imaging;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2010.2090709
  • Filename
    5648471