DocumentCode
1390928
Title
Increasing yield and reliability through postsilicon tuning
Volume
27
Issue
6
fYear
2010
Firstpage
2
Lastpage
2
Abstract
This issue of D&T features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.
Keywords
calibration and repair; design and test; low-power; mixed-signal; parameter variation; postsilicon tuning; process variation; yield and reliability;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.135
Filename
5648488
Link To Document