Title :
Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies
Author :
Chen, Wu-Hsin ; Jung, Byunghoo
Abstract :
Despite their inherent self-healing nature, noise (jitter) in phase-locked loops is sensitive to process and environmental variation. This article discusses automatic frequency calibration and amplitude control techniques that rely on a negative feedback loop with a large emphasis on digitally assisted calibration.
Keywords :
CMOS integrated circuits; calibration; phase locked loops; PLL; amplitude control techniques; automatic frequency calibration; deep-scaled CMOS technologies; digitally assisted calibration; negative feedback loop; self-healing phase-locked loops; Calibration; Detectors; Frequency control; Noise; Phase locked loops; Voltage-controlled oscillators; automatic amplitude control; design and test; digital-feedback control; noise control; phase-locked loop; self-healing; yield improvement;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.138
