DocumentCode :
1390985
Title :
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]
Author :
Davidson, S.
Volume :
27
Issue :
6
fYear :
2010
Firstpage :
72
Lastpage :
73
Abstract :
This is a review of Power-Aware Testing and Test Strategies for Low Power Devices (Patrick Girard, Nicola Nicolici, and Xiapqing Wen, eds.).
Keywords :
Book reviews; Low power electronics; Testing; design and test; literature survey; low power; power-aware testing; test strategies;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.122
Filename :
5648497
Link To Document :
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