• DocumentCode
    1391056
  • Title

    A comparison of PWB warpage due to simulated infrared and wave soldering processes

  • Author

    Polsky, Yarom ; Sutherlin, Walter ; Ume, I. Charles

  • Author_Institution
    MDI Inc., Sugar Land, TX, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    191
  • Lastpage
    199
  • Abstract
    Two types of bare, four layer printed wiring board (PWB) test vehicles were designed and fabricated to replicate simplified versions of typical boards produced by PWB manufacturers. The boards were subjected to simulated infrared and wave soldering reflow processes in a small lab-scale oven integrated with a shadow Moire out-of-plane displacement measurement system. The measured warpages were qualitatively and quantitatively analyzed at selected temperatures during the reflow profiles. The results presented compare and contrast the effects that simulated wave and infrared reflow soldering processes have on the warpage of two different PWB designs
  • Keywords
    displacement measurement; moire fringes; printed circuit manufacture; printed circuit testing; production testing; reflow soldering; wave soldering; PWB warpage; four layer printed wiring board; infrared soldering; reflow processes; shadow Moire out-of-plane displacement measurement; test vehicles; wave soldering processes; Assembly; Electronics packaging; Manufacturing processes; Mechanical engineering; Soldering; Temperature; Testing; Thermal expansion; Vehicles; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/6104.873247
  • Filename
    873247