Title :
Characterization of Co-Evaporated
Coated Conductors by Polarized-Raman Scattering Spectroscopy
Author :
Kim, G. ; Jo, W. ; Ha, H.S. ; Oh, S.S. ; Park, D.Y. ; Cheong, H.
Author_Institution :
Phys., Ewha Womans Univ., Seoul, South Korea
fDate :
6/1/2011 12:00:00 AM
Abstract :
SmBa2Cu3O7 (SmBCO)-coated conductors were grown on IBAD-MgO templates by in-situ co-evaporation using a drum-in-dual-chambers system. The conductors, which had a coating thickness of up to 3 μm, showed a critical temperature of 92 ~ 94 K and a critical current of 150 ~ 625 A/cm-w at 77 K in a self-field. The phonon modes and cation disorder of the SmBCO-coated conductors were examined by polarized Raman scattering spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy. XRD showed (00l) peaks for the SmBCO phase. The Raman spectra revealed common vibration modes, including Ba-Ba stretching, Cu2-Cu2 stretching, O(2)+/O(3)-, and apical O(4) modes. In addition, polarized-Raman spectra were obtained to examine the crystal orientation and grain growth behavior. Structural information from the Raman spectra turned out to be useful to determine the optimal thickness of SmBCO-coated conductors with high critical currents.
Keywords :
Raman spectra; barium compounds; critical currents; ion beam assisted deposition; phonons; samarium compounds; scanning electron microscopy; superconducting thin films; vibrational modes; IBAD-MgO template; SmBa2Cu3O; X-ray diffraction; cation disorder; coating thickness; coevaporated coated conductor; common vibration mode; critical current; drum-in-dual-chambers system; phonon mode; polarized-Raman scattering spectroscopy; scanning electron microscopy; Conductors; Critical current; Measurement by laser beam; Scanning electron microscopy; Scattering; Spectroscopy; X-ray scattering; Raman scattering spectroscopy; SmBCO coated conductors; structural properties; thickness dependence;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2089480