DocumentCode :
1391379
Title :
Study on the Current Spreading Effect and Light Extraction Enhancement of Vertical GaN/InGaN LEDs
Author :
Li, Chi-Kang ; Wu, Yuh-Renn
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ. (NTU), Taipei, Taiwan
Volume :
59
Issue :
2
fYear :
2012
Firstpage :
400
Lastpage :
407
Abstract :
This study analyzes the current spreading effect and light extraction efficiency (LEE) of lateral and vertical light-emitting diodes (LEDs). Specifically, this study uses a fully 2-D model that solves drift-diffusion and Poisson equations to investigate current flow paths and radiative recombination regions. The ray-tracing technique was used to calculate the LEE of the top surface. First, this study discusses the current spreading effect of the lateral and conventional vertical LED and determines the efficiency droop even with a transparent conducting layer. Different electrode configurations in the vertical LED were tested to optimize the current spreading effect, which, in turn, suppresses the carrier leakage and mitigates the efficiency droop under high injection conditions. This study also discusses the wall-plug efficiency in overall cases to identify the design rules for higher power conversion efficiency.
Keywords :
III-V semiconductors; Poisson equation; diffusion; electrodes; gallium compounds; indium compounds; light emitting diodes; power conversion; GaN-InGaN; Poisson equation; carrier leakage; current flow path; current spreading effect; drift-diffusion equation; electrode configuration; lateral light-emitting diode; light extraction enhancement; power conversion efficiency; radiative recombination region; ray-tracing technique; transparent conducting layer; vertical LED; vertical light-emitting diode; Charge carrier processes; Current density; Gallium nitride; Light emitting diodes; Mathematical model; Radiative recombination; Resistance; Current spreading; GaN; InGaN; droop; efficiency; leakage; light extraction; overflow; vertical light-emitting diode (LED);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2176132
Filename :
6096403
Link To Document :
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