DocumentCode :
1391450
Title :
Nonlinear capacitors for ESD protection
Author :
Hongyu Li ; Khilkevich, Victor ; Tianqi Li ; Pommerenke, David ; Seongtae Kwon ; Hackenberger, W.
Author_Institution :
Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Volume :
1
Issue :
4
fYear :
2012
Firstpage :
38
Lastpage :
46
Abstract :
In order to protect electronic products from Electrostatic Discharge (ESD) damage, multi-layer ceramic capacitors (MLCC) are often used to bypass the transient ESD energy. Most dielectric materials used in MLCC are nonlinear, since the dielectric constant decreases with increasing voltage, reducing the capacitance value, thus degrading the ESD protection effect. Using a large initial capacitance value will ensure sufficient ESD protection; however, the shunt capacitors also limit the signal bandwidth of the ESD-protected data channel, thus setting a maximal capacitance value at data voltage levels. This paper investigates the nonlinearity of capacitors and suggests improved tradeoff between ESD protection and data bandwidth by using the Antiferroelectric (AFE) capacitors as ESD protection. The dielectric constant of AFE material increases with increasing voltage. The voltage dependence of X7R and AFE capacitors are measured using static and nanosecond transient measurements. The ESD protection effectiveness with different material capacitors are compared by simulation. Due to very limited availability of suitable AFE material samples only hand-made capacitors have tested without investigating the long term stability of the material.
Keywords :
antiferroelectricity; capacitance; ceramic capacitors; dielectric materials; electric breakdown; electrostatic discharge; permittivity; AFE capacitors; AFE material; ESD damage; ESD energy; ESD protection effect; ESD-protected data channel; MLCC; antiferroelectric capacitors; data bandwidth; data voltage levels; dielectric constant; dielectric materials; electronic products; electrostatic discharge damage; hand-made capacitors; maximal capacitance value; multilayer ceramic capacitors; nanosecond transient measurements; nonlinear capacitors; shunt capacitors; signal bandwidth; static transient measurements; voltage dependence; Capacitance; Capacitors; Electrostatic discharges; Transient analysis; Transmission line measurements; Voltage measurement; AFE material; ESD protection; nonlinear capacitor;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2264
Type :
jour
DOI :
10.1109/MEMC.2012.6397056
Filename :
6397056
Link To Document :
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