Power loss associated with conducting and superconducting rough interfaces

Author

Holloway, Christopher L. ; Kuester, Edward F.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

Volume

48

Issue

10

fYear

2000

fDate

10/1/2000 12:00:00 AM

Firstpage

1601

Lastpage

1610

Abstract

In recent work, a generalized impedance boundary condition for two-dimensional conducting rough interfaces was derived. In this study, the impedance boundary condition is used to calculate the power loss associated with conducting rough interfaces. Results for two-dimensional conducting and superconducting roughness profiles are shown in this paper, and comparisons to other results in the literature are given. The importance of these roughness effects in microwave and millimeter-wave integrated circuits is also discussed. Suggestions are made to extend this study to three dimensional random rough interfaces

Keywords

integrated circuit design; losses; microwave integrated circuits; millimetre wave integrated circuits; rough surfaces; conducting rough interfaces; generalized impedance boundary condition; microwave integrated circuits; millimeter-wave integrated circuits; power loss; roughness profiles; superconducting rough interfaces; three dimensional random rough interfaces; two-dimensional surfaces; Boundary conditions; Circuits; Conductors; Dielectric losses; Dielectric substrates; Rough surfaces; Skin; Superconducting microwave devices; Surface impedance; Surface roughness;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.873886

Filename

873886