• DocumentCode
    1391742
  • Title

    Impact of light illumination and passivation layer on silicon finite-ground coplanar-waveguide transmission-line properties

  • Author

    Spiegel, Solon J. ; Madjar, Asher

  • Author_Institution
    Intel Cellular Commun. Div., Digital Signal Processing Commun., Givat Shmuel, Israel
  • Volume
    48
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1673
  • Lastpage
    1679
  • Abstract
    The modeling of silicon finite-ground coplanar-waveguide (FGCPW) transmission lines is presented in this paper. It is shown that the effective substrate conductivity increases in the presence of illumination and in the presence of a passivation layer in the slot regions independently. As a result, the losses of trenched FGCPW are lower than conventional FGCPW transmission lines. The strong dependence of the substrate conductivity on illumination suggests that optically controlled attenuators can be implemented with FGCPW transmission lines exhibiting practically no phase change between the different attenuation states. A new contrast ratio for optically controlled transmission lines is derived
  • Keywords
    coplanar waveguides; earthing; electrical conductivity; elemental semiconductors; losses; microwave photonics; optical control; passivation; silicon; transmission line theory; waveguide attenuators; Si; Si CPW transmission-line properties; contrast ratio; coplanar-waveguide transmission-line properties; effective substrate conductivity; finite-ground CPW transmission-line properties; light illumination; losses; optically controlled attenuators; optically controlled transmission lines; passivation layer; slot regions; transmission line modelling; trenched finite ground CPW; Conductivity; Coplanar transmission lines; Lighting; Optical attenuators; Optical control; Optical losses; Passivation; Propagation losses; Silicon; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.873894
  • Filename
    873894