• DocumentCode
    1391778
  • Title

    Input impedance of a coaxial-line fed probe in a thick coaxial-line waveguide

  • Author

    Yung, Edward Kai-Ning ; Xie, Ze Ming ; Chen, Ru Shan

  • Author_Institution
    Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, China
  • Volume
    48
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1707
  • Lastpage
    1711
  • Abstract
    The Green´s functions for determining the electromagnetic fields inside a semiinfinite coaxial line due to a radially directed, infinitesimally thin, and short-current element have been derived. In addition to the TEM mode, TE and TM modes are also considered. Based on the Green´s functions, a closed-form formula for determining the input impedance of a probe in a coaxial line terminated at an arbitrary load has been derived. Good agreement is observed between the theoretical results and experimental measurements over a wide frequency band for several configurations of interest. At low frequencies where the TEM mode is dominating, there is practically no difference between the results obtained by the rigorous analysis and those by a simple formula derived from the transmission-line theory. However, at frequencies where TE and TM modes are no longer insignificant, there is a noticeable discrepancy between the results obtained by the rigorous and not-so-rigorous methods
  • Keywords
    Green´s function methods; coaxial waveguides; electromagnetic fields; probes; Green´s functions; TE modes; TEM mode; TM modes; arbitrary load; closed-form formula; coaxial-line fed probe; electromagnetic fields; input impedance; semiinfinite coaxial line; short-current element; thick coaxial-line waveguide; transmission-line theory; Coaxial components; Electromagnetic waveguides; Frequency; Impedance; Probes; Rectangular waveguides; Surface waves; Tellurium; Transmission lines; Waveguide theory;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.873899
  • Filename
    873899