DocumentCode :
1391809
Title :
An efficient CAD-oriented large-signal MOSFET model
Author :
Grebennikov, Andrey V. ; Lin, Fujiang
Author_Institution :
Inst. of Microelectron., Singapore
Volume :
48
Issue :
10
fYear :
2000
fDate :
10/1/2000 12:00:00 AM
Firstpage :
1732
Lastpage :
1742
Abstract :
An efficient computer-aided-design-oriented large-signal microwave model for silicon MOSFETs is presented based on the well-founded small-signal equivalent circuit including self-heating effect and charge conservation condition. The proposed new single continuously differentiable empirical equations for drain current and gate capacitance are simple and quite accurate. The model parameters in the equations are constructed in such a way that they can be easily and straightforwardly extracted from measured data. The temperature effect is predicted by simply adopting the linear temperature-dependent model parameters for threshold voltage, saturation current, capacitance, and series resistances. The presented model is a good compromise between the simplicity of numerical calculations and the accuracy of final results that is desired by circuit designers in nonlinear circuit simulation
Keywords :
MOSFET; capacitance; circuit CAD; circuit simulation; elemental semiconductors; equivalent circuits; microwave field effect transistors; semiconductor device models; silicon; thermal analysis; CAD-oriented MOSFET model; Si; Si MOSFETs; charge conservation condition; computer-aided-design-oriented model; continuously differentiable empirical equations; drain current; gate capacitance; large-signal MOSFET model; large-signal microwave model; linear temperature-dependent model parameters; model parameters extraction; nonlinear circuit simulation; saturation current; self-heating effect; series resistances; small-signal equivalent circuit; temperature effect prediction; threshold voltage; Capacitance; Data mining; Differential equations; Electrical resistance measurement; Equivalent circuits; MOSFET circuits; Predictive models; Silicon; Temperature; Threshold voltage;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.873903
Filename :
873903
Link To Document :
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