DocumentCode
1391942
Title
Selective Hardening: Toward Cost-Effective Error Tolerance
Author
Polian, Ilia ; Hayes, John P.
Volume
28
Issue
3
fYear
2011
Firstpage
54
Lastpage
63
Abstract
As ICs shrink into the nanometer range, they are increasingly subject to errors induced by physical faults. Traditional hardening for error mitigation consumes too much area and energy to be cost-effective in commercial applications. Selective hardening, applied only to a design´s most error-sensitive parts, offers an attractive alternative. This article reviews recently proposed techniques to selectively harden nanoelectronics and achieve very low error levels.
Keywords
fault tolerance; hardening; integrated circuits; nanoelectronics; IC; cost-effective error tolerance; nanoelectronics; selective hardening; Circuit faults; Error analysis; Fault tolerance; Flip-flops; Logic gates; Nanostructured materials; Programmable logic arrays; Redundancy; design and test; error tolerance; fault tolerance; reliability; selective hardening; soft errors;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.120
Filename
5654485
Link To Document