• DocumentCode
    1391942
  • Title

    Selective Hardening: Toward Cost-Effective Error Tolerance

  • Author

    Polian, Ilia ; Hayes, John P.

  • Volume
    28
  • Issue
    3
  • fYear
    2011
  • Firstpage
    54
  • Lastpage
    63
  • Abstract
    As ICs shrink into the nanometer range, they are increasingly subject to errors induced by physical faults. Traditional hardening for error mitigation consumes too much area and energy to be cost-effective in commercial applications. Selective hardening, applied only to a design´s most error-sensitive parts, offers an attractive alternative. This article reviews recently proposed techniques to selectively harden nanoelectronics and achieve very low error levels.
  • Keywords
    fault tolerance; hardening; integrated circuits; nanoelectronics; IC; cost-effective error tolerance; nanoelectronics; selective hardening; Circuit faults; Error analysis; Fault tolerance; Flip-flops; Logic gates; Nanostructured materials; Programmable logic arrays; Redundancy; design and test; error tolerance; fault tolerance; reliability; selective hardening; soft errors;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.120
  • Filename
    5654485