Title :
Selective Hardening: Toward Cost-Effective Error Tolerance
Author :
Polian, Ilia ; Hayes, John P.
Abstract :
As ICs shrink into the nanometer range, they are increasingly subject to errors induced by physical faults. Traditional hardening for error mitigation consumes too much area and energy to be cost-effective in commercial applications. Selective hardening, applied only to a design´s most error-sensitive parts, offers an attractive alternative. This article reviews recently proposed techniques to selectively harden nanoelectronics and achieve very low error levels.
Keywords :
fault tolerance; hardening; integrated circuits; nanoelectronics; IC; cost-effective error tolerance; nanoelectronics; selective hardening; Circuit faults; Error analysis; Fault tolerance; Flip-flops; Logic gates; Nanostructured materials; Programmable logic arrays; Redundancy; design and test; error tolerance; fault tolerance; reliability; selective hardening; soft errors;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.120