• DocumentCode
    1392251
  • Title

    Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy

  • Author

    Farina, Marcello ; Lucesoli, A. ; Di Donato, A. ; Mencarelli, Davide ; Maccari, Leonardo ; Venanzoni, G. ; Morini, A. ; Rozzi, T.

  • Author_Institution
    Dipt. di Ing. Biomedica, Elettron. e Telecomun., Univ. Politec. delle Marche, Ancona, Italy
  • Volume
    46
  • Issue
    1
  • fYear
    2010
  • Firstpage
    50
  • Lastpage
    52
  • Abstract
    An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.
  • Keywords
    microwave measurement; noise; scanning probe microscopy; frequency dependent characteristic; near-field microwave microscopy; noise reduction; scanning probe microscopy; ultramicroscopy;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.2859
  • Filename
    5395564
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1392251