Title :
Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy
Author :
Farina, Marcello ; Lucesoli, A. ; Di Donato, A. ; Mencarelli, Davide ; Maccari, Leonardo ; Venanzoni, G. ; Morini, A. ; Rozzi, T.
Author_Institution :
Dipt. di Ing. Biomedica, Elettron. e Telecomun., Univ. Politec. delle Marche, Ancona, Italy
Abstract :
An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.
Keywords :
microwave measurement; noise; scanning probe microscopy; frequency dependent characteristic; near-field microwave microscopy; noise reduction; scanning probe microscopy; ultramicroscopy;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.2859
