• DocumentCode
    1392553
  • Title

    Parameter monitoring using neural-network-processed chromaticity

  • Author

    Ahmed, S. ; Russell, P. ; Lisboa, P. ; Jones, G.R.

  • Author_Institution
    Dept. of Electr. Eng. & Electron., Liverpool Univ., UK
  • Volume
    144
  • Issue
    6
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    257
  • Lastpage
    262
  • Abstract
    A PC-based neural-network processing system is described for the interpretation of chromatic sensor information monitored remotely using a CCD camera. Chromaticity based monitoring provides a means of simple data pre-processing to reduce system noise due to total intensity variation. However, sensing elements using chromaticity usually show complex variations in chromaticity with measurand changes. This contribution shows how these complex variations may be processed to yield high resolution values of a measurand. The paper presents a novel application of neural networks for monitoring temperatures using thermochromic materials and to perform 2D pressure analysis using photoelastic materials. The inherent complex mapping and generalisation abilities of multilayered perceptrons (MLP) make them ideal for processing the detected signals. Results are presented showing that the neural network can provide levels of resolution and performance for remotely addressing chromatic transducers, which are acceptable for detailed metrological applications
  • Keywords
    CCD image sensors; liquid crystal devices; microcomputer applications; multilayer perceptrons; optical variables measurement; pressure transducers; remote sensing; spectral methods of temperature measurement; stress analysis; 2D pressure analysis; CCD camera; PC-based neural-network processing system; chromatic sensor information; chromatic transducers; detailed metrological applications; multilayered perceptrons; neural-network-processed chromaticity; parameter monitoring; photoelastic materials; temperature monitoring; thermochromic materials;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:19971470
  • Filename
    640002