DocumentCode :
1392626
Title :
InAlAs Avalanche Photodiode With Type-II Superlattice Absorber for Detection Beyond 2 \\mu\\hbox {m}
Author :
Ong, Daniel S G ; Ng, Jo Shien ; Goh, Yu Ling ; Tan, Chee Hing ; Zhang, Shiyong ; David, John P R
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Volume :
58
Issue :
2
fYear :
2011
Firstpage :
486
Lastpage :
489
Abstract :
An avalanche photodiode (APD) using a InAlAs multiplication region and a type-II InGaAs/GaAsSb superlattice as the absorber (both lattice matched to InP) is reported. An optical and electrical characterization of the photodiode is performed. The APD exhibited an absorption cutoff wavelength of 2.5 μm, which is expected from the InGaAs/GaAsSb superlattice. A responsivity of 0.47 A/W (without gain) for the APD at a 2004-nm wavelength was demonstrated. The APD breakdown voltage showed a weak temperature dependence of ~40 mV/K, as a result of the excellent temperature stability in InAlAs.
Keywords :
III-V semiconductors; aluminium compounds; avalanche photodiodes; electric breakdown; gallium arsenide; indium compounds; semiconductor superlattices; InAlAs; InGaAs-GaAsSb; avalanche photodiode; breakdown voltage; electrical characterization; lattice matched; multiplication region; optical characterization; type-II superlattice absorber; wavelength 2004 nm; Avalanche photodiodes; Dark current; Indium gallium arsenide; Indium phosphide; P-i-n diodes; Superlattices; Temperature measurement; Avalanche photodiode (APD); infrared; quantum well (QW); superlattice; type II;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2010.2090352
Filename :
5654585
Link To Document :
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