DocumentCode
1392626
Title
InAlAs Avalanche Photodiode With Type-II Superlattice Absorber for Detection Beyond 2
Author
Ong, Daniel S G ; Ng, Jo Shien ; Goh, Yu Ling ; Tan, Chee Hing ; Zhang, Shiyong ; David, John P R
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Volume
58
Issue
2
fYear
2011
Firstpage
486
Lastpage
489
Abstract
An avalanche photodiode (APD) using a InAlAs multiplication region and a type-II InGaAs/GaAsSb superlattice as the absorber (both lattice matched to InP) is reported. An optical and electrical characterization of the photodiode is performed. The APD exhibited an absorption cutoff wavelength of 2.5 μm, which is expected from the InGaAs/GaAsSb superlattice. A responsivity of 0.47 A/W (without gain) for the APD at a 2004-nm wavelength was demonstrated. The APD breakdown voltage showed a weak temperature dependence of ~40 mV/K, as a result of the excellent temperature stability in InAlAs.
Keywords
III-V semiconductors; aluminium compounds; avalanche photodiodes; electric breakdown; gallium arsenide; indium compounds; semiconductor superlattices; InAlAs; InGaAs-GaAsSb; avalanche photodiode; breakdown voltage; electrical characterization; lattice matched; multiplication region; optical characterization; type-II superlattice absorber; wavelength 2004 nm; Avalanche photodiodes; Dark current; Indium gallium arsenide; Indium phosphide; P-i-n diodes; Superlattices; Temperature measurement; Avalanche photodiode (APD); infrared; quantum well (QW); superlattice; type II;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2090352
Filename
5654585
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