• DocumentCode
    1392626
  • Title

    InAlAs Avalanche Photodiode With Type-II Superlattice Absorber for Detection Beyond 2 \\mu\\hbox {m}

  • Author

    Ong, Daniel S G ; Ng, Jo Shien ; Goh, Yu Ling ; Tan, Chee Hing ; Zhang, Shiyong ; David, John P R

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
  • Volume
    58
  • Issue
    2
  • fYear
    2011
  • Firstpage
    486
  • Lastpage
    489
  • Abstract
    An avalanche photodiode (APD) using a InAlAs multiplication region and a type-II InGaAs/GaAsSb superlattice as the absorber (both lattice matched to InP) is reported. An optical and electrical characterization of the photodiode is performed. The APD exhibited an absorption cutoff wavelength of 2.5 μm, which is expected from the InGaAs/GaAsSb superlattice. A responsivity of 0.47 A/W (without gain) for the APD at a 2004-nm wavelength was demonstrated. The APD breakdown voltage showed a weak temperature dependence of ~40 mV/K, as a result of the excellent temperature stability in InAlAs.
  • Keywords
    III-V semiconductors; aluminium compounds; avalanche photodiodes; electric breakdown; gallium arsenide; indium compounds; semiconductor superlattices; InAlAs; InGaAs-GaAsSb; avalanche photodiode; breakdown voltage; electrical characterization; lattice matched; multiplication region; optical characterization; type-II superlattice absorber; wavelength 2004 nm; Avalanche photodiodes; Dark current; Indium gallium arsenide; Indium phosphide; P-i-n diodes; Superlattices; Temperature measurement; Avalanche photodiode (APD); infrared; quantum well (QW); superlattice; type II;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2090352
  • Filename
    5654585