DocumentCode :
1392705
Title :
All-Digital Adaptive Clocking to Tolerate Transient Supply Noise in a Low-Voltage Operation
Author :
Kwanyeob Chae ; Mukhopadhyay, Saibal
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
59
Issue :
12
fYear :
2012
Firstpage :
893
Lastpage :
897
Abstract :
This paper presents an all-digital technique to modulate the system clock and local clocks in response to global and local voltage noise to prevent timing errors during low-voltage operation. The critical path replica circuits are utilized to change the clock period within a clock cycle in response to transient supply noise. Measurement in 130-nm CMOS demonstrates reliable operation of a test pipeline over a wide dc (1.3-0.74 V) voltage range. At 0.81 V, the pipeline operates without timing errors at 7.2% higher frequency even under a 189-mV transient voltage droop.
Keywords :
CMOS digital integrated circuits; clocks; integrated circuit noise; transient analysis; CMOS measurement; all-digital adaptive clocking technique; clock cycle; critical path replica circuits; local clocks; local voltage noise; low-voltage operation; size 130 nm; system clock modulation; test pipeline; timing errors; transient supply noise; transient voltage droop; voltage 0.81 V; voltage 1.3 V to 0.74 V; voltage 189 mV; Delays; Frequency measurement; Frequency modulation; Low voltage; Noise measurement; Clocking; low voltage; supply noise;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2012.2231033
Filename :
6400238
Link To Document :
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