• DocumentCode
    1392772
  • Title

    Kuijk Bandgap Voltage Reference With High Immunity to EMI

  • Author

    Redouté, Jean-Michel ; Steyaert, Michiel

  • Author_Institution
    Dept. of Electr. Eng. (ESAT), Katholieke Univ. Leuven, Leuven, Belgium
  • Volume
    57
  • Issue
    2
  • fYear
    2010
  • Firstpage
    75
  • Lastpage
    79
  • Abstract
    This brief evaluates the effect of conducted electromagnetic interference (EMI) that is injected in the power supply of a classic Kuijk bandgap reference voltage circuit. Two modified Kuijk bandgap topologies with high immunity to EMI are introduced and compared to the original structure. Measurements of a test IC confirm the theoretical analyses.
  • Keywords
    electromagnetic interference; integrated circuit testing; reference circuits; EMI; Kuijk bandgap voltage reference; electromagnetic interference; high immunity; integrated circuit testing; power supply; Bandgap voltage references; electromagnetic compatibility; electromagnetic interference;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2009.2037991
  • Filename
    5395642
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1392772