• DocumentCode
    1392783
  • Title

    Measurement and prediction of high spatial resolution indoor radio channel characteristic map

  • Author

    Suzuki, Hajime ; Mohan, Ananda S.

  • Author_Institution
    Fac. of Eng., Univ. of Technol., Sydney, NSW, Australia
  • Volume
    49
  • Issue
    4
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    1321
  • Lastpage
    1333
  • Abstract
    This paper presents a new frustum ray tracing technique (FRTT) for the prediction of channel characteristic maps in a complex in-building environment. FRTT utilizes a fast line-clipping algorithm and does not rely on the conventional time-consuming ray intersection tests. Dielectric properties of building materials are empirically derived from in situ transmission coefficient measurements, which have enhanced the accuracy of prediction results. The FRTT is found to be more accurate and computationally efficient than the conventional ray tracing technique for area-type predictions. A detailed comparison has been made using measured narrow-band and wide-band channel characteristic maps with high spatial resolution (0.2 wavelength) at line-of-sight (LOS), non-LOS, and a corner transition region inside a multifloored building. The agreement between FRTT prediction and measurement appears to be excellent
  • Keywords
    dielectric properties; electromagnetic wave transmission; indoor radio; radiowave propagation; ray tracing; FRTT; area-type predictions; building materials; characteristic map; corner transition; dielectric properties; frustum ray tracing technique; high spatial resolution; in-building environment; indoor radio channel; line-clipping algorithm; line-of-sight; multifloored building; nonLOS; transmission coefficient measurements; Accuracy; Building materials; Computer vision; Dielectric measurements; Indoor radio communication; Narrowband; Ray tracing; Spatial resolution; Testing; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Vehicular Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/25.875250
  • Filename
    875250