DocumentCode :
1392932
Title :
On the Equivalence of a Conducting Plate in a Laboratory Experiment to a Real Earth
Author :
Ametani, Akihiro ; Nishitsuji, Masanori ; Nagaoka, Naoto ; Baba, Yoshihiro ; Okabe, Shigemitsu
Author_Institution :
Dept. of Electr. Eng., Doshisha Univ., Kyoto, Japan
Volume :
52
Issue :
3
fYear :
2010
Firstpage :
691
Lastpage :
698
Abstract :
This paper investigates the validity and the application limit of experimental results on a scale model above a conducting plate, such as an aluminum (Al) or copper (Cu) plate, representing a real power system, which is too large for experimental measurements. The surge characteristics on a scale model of an overhead conductor above an Al plate are compared with that above a real earth. The experimental results are compared with analytical and numerical simulation results by the electromagnetic transients program and finite-difference time domain method. It is clear that the Al plate can represent the real earth only for an initial part of a surge waveform until reflection comes back from the other end of the conductor. The surge waveform on the Al plate noticeably deviates from that on the real earth as time passes. Correspondingly, the characteristic impedance of the Al plate differs from that on the real earth depending on the conductor height and the separation between the conductors.
Keywords :
EMTP; conducting bodies; finite difference time-domain analysis; overhead line conductors; soil; telecommunication transmission lines; Conducting Plate; Real Earth; aluminum plate; copper plate; electromagnetic transients program; finite difference time domain method; overhead conductor; surge; Aluminum; Conductors; Copper; Earth; Laboratories; Power system analysis computing; Power system measurements; Power system modeling; Power system simulation; Surges; Characteristic impedance; conductor plate; electromagnetic transients program (EMTP); finite-difference time domain (FDTD); real earth; scale model; surge;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2009.2036161
Filename :
5395665
Link To Document :
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