Vertical Dependence of Refractive Index Structure Constant in Lowest Troposphere

Author

Grabner, Martin ; Kvicera, Vaclav ; Pechac, Pavel ; Jicha, Otakar

Author_Institution

Freq. Eng. Dept., Czech Metrol. Inst., Prague, Czech Republic

Volume

10

fYear

2011

fDate

7/3/1905 12:00:00 AM

Firstpage

1473

Lastpage

1475

Abstract

Vertical profiles of atmospheric refractivity are indirectly measured at heights of up to 150 m above the ground using meteorological sensors located at 19 heights. The structure constant of the refractive index C_n is calculated from data measured over a one-year period using its definition relation. Linear regression in heights is applied to a structure constant vertical dependence to obtain single and joint annual statistics of the near ground value of C_n and of its vertical gradient in the lowest troposphere. Approximate probability models are given with C_n being log-normal and the vertical gradient normally distributed.

Keywords

approximation theory; atmospheric electromagnetic wave propagation; microwave measurement; probability; approximate probability models; atmospheric refractivity; joint annual statistics; linear regression; lowest troposphere; meteorological sensors; one-year period; refractive index structure constant; vertical dependence; vertical gradient; Linear regression; Microwave propagation; Refractive index; Terrestrial atmosphere; Atmospheric refractivity; microwave propagation; scintillation; structure constant;

fLanguage

English

Journal_Title

Antennas and Wireless Propagation Letters, IEEE

Publisher

ieee

ISSN

1536-1225

Type

jour

DOI

10.1109/LAWP.2011.2178809

Filename

6097015