DocumentCode :
1392986
Title :
Empirical investigation into the correlation between vignetting effect and the quality of sensor pattern noise
Author :
Li, Chiao-Ting ; Satta, Riccardo
Author_Institution :
Dept. of Comput. Sci., Univ. of Warwick, Coventry, UK
Volume :
6
Issue :
6
fYear :
2012
fDate :
11/1/2012 12:00:00 AM
Firstpage :
560
Lastpage :
566
Abstract :
The sensor pattern noise (SPN) is a unique attribute of the content of images that can facilitate identification of source digital imaging devices. Owing to its potential in forensic applications, it has drawn much attention in the digital forensic community. Although much work has been done on the applications of the SPN, investigations into its characteristics have been largely overlooked in the literature. In this study, the authors aim to fill this gap by providing insight into the characteristic dependency of the SPN quality on its location in images. They have observed that the SPN components at the image periphery are not reliable for the task of source camera identification, and tend to cause higher false-positive rates. Empirical evidence is presented in this work. The authors suspect that this location-dependent SPN quality degradation has strong connection with the so-called `vignetting effect`, as both exhibit the same type of location dependency. The authors recommend that when image blocks are to be used for forensic investigations, they should be taken from the image centre before SPN extraction is performed in order to reduce false-positive rate.
Keywords :
digital forensics; image processing; image sensors; digital forensic community; false-positive rate reduction; forensic application; image periphery; location-dependent SPN quality degradation; sensor pattern noise; source camera identification; source digital imaging device identification; vignetting effect;
fLanguage :
English
Journal_Title :
Computer Vision, IET
Publisher :
iet
ISSN :
1751-9632
Type :
jour
DOI :
10.1049/iet-cvi.2012.0044
Filename :
6400408
Link To Document :
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