• DocumentCode
    1393010
  • Title

    Test scheduling for core-based systems using mixed-integer linear programming

  • Author

    Chakrabarty, Krishnendu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • Volume
    19
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1163
  • Lastpage
    1174
  • Abstract
    We present optimal solutions to the test scheduling problem for core-based systems. Given a set of tasks (test sets for the cores), a set of test resources (e.g., test buses, BIST hardware) and a test access architecture, we determine start times for the tasks such that the total test application time is minimized. We show that the test scheduling decision problem is equivalent to the m-processor open shop scheduling problem and is therefore NP-complete. However a commonly encountered instance of this problem (m=2) can be solved in polynomial time. For the general case (m>2), we present a mixed-integer linear programming (MILP) model for optimal scheduling and apply it to a representative core-based system using an MILP solver available in the public domain. We also extend the MILP model to allow optimal test set selection from a set of alternatives. Finally, we present an efficient heuristic algorithm for handling larger systems for which the MILP model may be infeasible
  • Keywords
    application specific integrated circuits; built-in self test; computational complexity; integer programming; integrated circuit testing; linear programming; logic testing; processor scheduling; BIST hardware; MILP model; NP-complete; core-based systems; heuristic algorithm; m-processor open shop scheduling problem; mixed-integer linear programming; polynomial time; start times; test access architecture; test buses; test resources; test scheduling; Automatic testing; Built-in self-test; Circuit testing; Integrated circuit testing; Job shop scheduling; Linear programming; Logic testing; Optimal scheduling; System testing; System-on-a-chip;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.875306
  • Filename
    875306