Title :
Stable Electric Field TDIE Solvers via Quasi-Exact Evaluation of MOT Matrix Elements
Author :
Shi, Yifei ; Xia, Ming-Yao ; Chen, Ru-Shan ; Michielssen, Eric ; Lu, Mingyu
Author_Institution :
Dept. of Commun. Eng., Nanjing Univ. of Sci. & Technol., Nanjing, China
Abstract :
Prior theoretical studies and experience confirm that the stability of marching-on-in-time (MOT) solvers pertinent to the analysis of scattering from free-standing three-dimensional perfect electrically conducting surfaces hinges on the accurate evaluation of MOT matrix elements resulting from a Galerkin discretization of the underlying time domain integral equation (TDIE). Unfortunately, the accurate evaluation of the four-dimensional spatial integrals involved in the expressions for these matrix elements is prohibitively expensive when performed by computational means. Here, a method that permits the quasi-exact evaluation of MOT matrix elements is presented. Specifically, the proposed method permits the analytical evaluation of three out of the four spatial integrations, leaving only one integral to be evaluated numerically. Since the latter has finite range and a piecewise smooth integrand, it can be evaluated to very high accuracy using standard quadrature rules. As a result, the proposed method permits the fast evaluation of MOT matrix elements with arbitrary (user-specified) accuracy. Extensive numerical experiments show that an MOT solver for the electric field TDIE that uses the proposed quasi-exact method is stable for a very wide range of time step sizes and yields solutions that decay exponentially after the excitation vanishes.
Keywords :
Galerkin method; electric field integral equations; matrix algebra; Galerkin discretization; MOT matrix elements; marching-on-in-time solvers; quadrature rules; quasi-exact evaluation; stable electric field TDIE solvers; time domain integral equation; Exact integration; late time instability; marching-on-in-time (MOT); time domain integral equations;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2010.2096402