Title :
Non-local total variation based low-dose Computed Tomography denoising
Author :
Hashemi, SayedMasoud ; Beheshti, Soosan ; Cobbold, Richard S. C. ; Paul, Narinder S.
Author_Institution :
Inst. of Biomater. & Biomed. Eng., Univ. of Toronto (UofT), Toronto, ON, Canada
Abstract :
Radiation dose of X-ray Computed Tomography (CT) imaging has raised a worldwide health concern. Therefore, low-dose CT imaging has been of a huge interest in the last decade. However, lowering the radiation dose degrades the image quality by increasing the noise level, which may reduce the diagnostic performance of the images. As a result, image denoising is one of the fundamental tasks in low-dose CT imaging. One of the state of art denoising methods, which has been successfully used in this area, is Total Variation (TV) denoising. Nevertheless, if the parameters of the TV denoising are not optimally adjusted or the algorithm is not stopped in an appropriate point, some of the small structures will be removed by this method. Here, we provide a solution to this problem by proposing a modified nonlocal TV method, called probabilistic NLTV (PNLTV). Denoising performance of PNLTV is improved by using better weights and an appropriate stopping criterion based on statistics of image wavelet coefficients. Non-locality allows the algorithm to preserve the image texture, which combined with the proposed stopping criterion enables PNLTV to keep fine details unchanged.
Keywords :
computerised tomography; diagnostic radiography; feature extraction; image denoising; image texture; medical image processing; probability; statistical analysis; X-ray computed tomography imaging; image quality degradation; image texture preservation; image wavelet coefficient statistics; nonlocal total variation based low-dose computed tomography denoising; probabilistic NLTV; Biomedical imaging; Computed tomography; Noise; Noise reduction; TV; X-ray imaging;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
DOI :
10.1109/EMBC.2014.6943782