• DocumentCode
    1393680
  • Title

    A Common Language Framework for Next-Generation Embedded Testing

  • Author

    Portolan, Michele ; Goyal, Suresh ; Van Treuren, Bradford ; Chiang, Chen-Huan ; Chakraborty, Tapan J. ; Cook, Thomas B.

  • Author_Institution
    Bell Labs. Ireland, Ireland
  • Volume
    27
  • Issue
    5
  • fYear
    2010
  • Firstpage
    36
  • Lastpage
    49
  • Abstract
    This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.
  • Keywords
    automatic test pattern generation; embedded systems; industrial property; integrated circuit testing; system-on-chip; IEEE P1687 standard; NSDL code; SoC IP; automated test generation; common language framework; new scan description language; next-generation embedded testing; Testing; IEEE P1687; NSDL; built-in tests; design and test; languages; test generation; testing strategies; testing tools;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.1
  • Filename
    5396291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1393680