Title :
A Common Language Framework for Next-Generation Embedded Testing
Author :
Portolan, Michele ; Goyal, Suresh ; Van Treuren, Bradford ; Chiang, Chen-Huan ; Chakraborty, Tapan J. ; Cook, Thomas B.
Author_Institution :
Bell Labs. Ireland, Ireland
Abstract :
This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.
Keywords :
automatic test pattern generation; embedded systems; industrial property; integrated circuit testing; system-on-chip; IEEE P1687 standard; NSDL code; SoC IP; automated test generation; common language framework; new scan description language; next-generation embedded testing; Testing; IEEE P1687; NSDL; built-in tests; design and test; languages; test generation; testing strategies; testing tools;
Journal_Title :
Design & Test of Computers, IEEE
