DocumentCode :
1393852
Title :
Piecewise approximate circuit simulation
Author :
Visweswariah, Chandramouli ; Rohrer, Ronald A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
10
Issue :
7
fYear :
1991
fDate :
7/1/1991 12:00:00 AM
Firstpage :
861
Lastpage :
870
Abstract :
A simulation methodology for the nonlinear transient analysis of electrical circuits is described. Equations are formulated on the tree/link basis. All branch and node variables are modeling to be piecewise approximate in time. Electronic devices are represented by empirical table models of I-V characteristics. The table models may be built at various levels of precision, and concomitant accuracy levels are reflected in the simulation results. Simulation accuracy may be varied on a branch-by-branch basis or global basis, this permitting the user to distribute computer resources in a meaningful manner. The simulation algorithm is event driven and fully exploits temporal sparsity in the underlying circuit equations. Mechanisms for dealing with steady-state situations and stiff circuits have been investigated. A prototype simulator, SPECS, has been developed and tested on large industrial integrated circuits. It has proven to be a reliable and efficient tool in the analysis of digital and mixed circuits
Keywords :
circuit analysis computing; digital circuits; transient response; I-V characteristics; SPECS; circuit simulation; digital circuits; electrical circuits; empirical table models; event driven; integrated circuits; mixed circuits; nonlinear transient analysis; piecewise approximate; prototype simulator; simulation methodology; steady-state situations; stiff circuits; Analytical models; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Discrete event simulation; Distributed computing; Nonlinear equations; Steady-state; Transient analysis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.87597
Filename :
87597
Link To Document :
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