• DocumentCode
    1394017
  • Title

    Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms

  • Author

    Fatemi, Emad ; Jerome, Joseph ; Osher, Stanley

  • Author_Institution
    Dept. of Math., California Univ., Los Angeles, CA, USA
  • Volume
    10
  • Issue
    2
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    232
  • Lastpage
    244
  • Abstract
    Simulation results for the hydrodynamic model are presented for an n+-n-n+ diode by use of shock-capturing numerical algorithms applied to the transient model with subsequent passage to the steady state. The numerical method is first order in time, but of high spatial order in regions of smoothness. Implementation typically requires a few thousand time steps. These algorithms, termed essentially nonoscillatory, have been successfully applied in other contexts to model the flow in gas dynamics, magnetohydrodynamics, and other physical situations involving the conservation laws of fluid mechanics. The presented semiconductor simulations reveal temporal and spatial velocity overshot, as well as overshoot relative to an electric field induced by the Poisson equation. Shocks are observed in the transient simulations for certain low-temperature parameter regimes
  • Keywords
    semiconductor device models; semiconductor diodes; transient response; Poisson equation; high order numerical algorithms; hydrodynamic device model; induced electric field; low-temperature parameter regimes; n+-n-n+ diode; nonoscillatory shock capturing algorithms; semiconductor simulations; transient model; velocity overshot; Electric shock; Electrons; Hydrodynamics; Lattices; Mathematics; Poisson equations; Semiconductor diodes; Silicon; Steady-state; Temperature;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.68410
  • Filename
    68410