DocumentCode :
1394017
Title :
Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms
Author :
Fatemi, Emad ; Jerome, Joseph ; Osher, Stanley
Author_Institution :
Dept. of Math., California Univ., Los Angeles, CA, USA
Volume :
10
Issue :
2
fYear :
1991
fDate :
2/1/1991 12:00:00 AM
Firstpage :
232
Lastpage :
244
Abstract :
Simulation results for the hydrodynamic model are presented for an n+-n-n+ diode by use of shock-capturing numerical algorithms applied to the transient model with subsequent passage to the steady state. The numerical method is first order in time, but of high spatial order in regions of smoothness. Implementation typically requires a few thousand time steps. These algorithms, termed essentially nonoscillatory, have been successfully applied in other contexts to model the flow in gas dynamics, magnetohydrodynamics, and other physical situations involving the conservation laws of fluid mechanics. The presented semiconductor simulations reveal temporal and spatial velocity overshot, as well as overshoot relative to an electric field induced by the Poisson equation. Shocks are observed in the transient simulations for certain low-temperature parameter regimes
Keywords :
semiconductor device models; semiconductor diodes; transient response; Poisson equation; high order numerical algorithms; hydrodynamic device model; induced electric field; low-temperature parameter regimes; n+-n-n+ diode; nonoscillatory shock capturing algorithms; semiconductor simulations; transient model; velocity overshot; Electric shock; Electrons; Hydrodynamics; Lattices; Mathematics; Poisson equations; Semiconductor diodes; Silicon; Steady-state; Temperature;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.68410
Filename :
68410
Link To Document :
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