DocumentCode
1394017
Title
Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms
Author
Fatemi, Emad ; Jerome, Joseph ; Osher, Stanley
Author_Institution
Dept. of Math., California Univ., Los Angeles, CA, USA
Volume
10
Issue
2
fYear
1991
fDate
2/1/1991 12:00:00 AM
Firstpage
232
Lastpage
244
Abstract
Simulation results for the hydrodynamic model are presented for an n+-n-n+ diode by use of shock-capturing numerical algorithms applied to the transient model with subsequent passage to the steady state. The numerical method is first order in time, but of high spatial order in regions of smoothness. Implementation typically requires a few thousand time steps. These algorithms, termed essentially nonoscillatory, have been successfully applied in other contexts to model the flow in gas dynamics, magnetohydrodynamics, and other physical situations involving the conservation laws of fluid mechanics. The presented semiconductor simulations reveal temporal and spatial velocity overshot, as well as overshoot relative to an electric field induced by the Poisson equation. Shocks are observed in the transient simulations for certain low-temperature parameter regimes
Keywords
semiconductor device models; semiconductor diodes; transient response; Poisson equation; high order numerical algorithms; hydrodynamic device model; induced electric field; low-temperature parameter regimes; n+-n-n+ diode; nonoscillatory shock capturing algorithms; semiconductor simulations; transient model; velocity overshot; Electric shock; Electrons; Hydrodynamics; Lattices; Mathematics; Poisson equations; Semiconductor diodes; Silicon; Steady-state; Temperature;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.68410
Filename
68410
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