DocumentCode
1394039
Title
Iterative algorithms for computing aliasing probabilities
Author
Ivanov, André ; Starke, Corot W. ; Agarwal, Vinod K. ; Daehn, Wilfried ; Gruetzner, Matthias ; Williams, Tom W.
Author_Institution
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume
10
Issue
2
fYear
1991
fDate
2/1/1991 12:00:00 AM
Firstpage
260
Lastpage
265
Abstract
An algorithm, ALG-MK, for computing exact aliasing probabilities in signature analysis is derived from a Markov process model of signature analysis. A previous algorithm, ALG-BL, which was derived from a Boolean expressions formulation of the problem, is reformulated so that it can also be reviewed as being based on a Markov process. Both algorithms compute exact aliasing probabilities in signature analysis. The computational complexities of the two models are compared. It is shown that the time complexity of the iterative algorithm ALG-MK is O (L 2k), disregarding slight possible start-up and termination improvements, while that of ALG-BL is O (Lf 2k+f), where k is the size of the signature register, f is the number of feedback taps, and L is the test sequence length. ALG-BL requires more shift and add operations, but requires half the number of floating-point multiplications that ALG-MK requires. The space complexity of ALG-MK is O (2k), while that of ALG-BL is O (2k+f ). It is also shown that ALG-MK and ALG-BL are formally related through a linear transformation of their state vectors. Both algorithms may be used to study aliasing under generalized error models
Keywords
Markov processes; built-in self test; computational complexity; integrated circuit testing; iterative methods; logic testing; probability; ALG-MK; Markov process model; aliasing probabilities; compaction techniques; computational complexities; floating-point multiplications; iterative algorithm; shift/add operations; signature analysis; space complexity; time complexity; Automatic testing; Built-in self-test; Circuit testing; Compaction; Feedback; Iterative algorithms; Markov processes; Polynomials; Probability; Registers;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.68413
Filename
68413
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