• DocumentCode
    1394039
  • Title

    Iterative algorithms for computing aliasing probabilities

  • Author

    Ivanov, André ; Starke, Corot W. ; Agarwal, Vinod K. ; Daehn, Wilfried ; Gruetzner, Matthias ; Williams, Tom W.

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • Volume
    10
  • Issue
    2
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    260
  • Lastpage
    265
  • Abstract
    An algorithm, ALG-MK, for computing exact aliasing probabilities in signature analysis is derived from a Markov process model of signature analysis. A previous algorithm, ALG-BL, which was derived from a Boolean expressions formulation of the problem, is reformulated so that it can also be reviewed as being based on a Markov process. Both algorithms compute exact aliasing probabilities in signature analysis. The computational complexities of the two models are compared. It is shown that the time complexity of the iterative algorithm ALG-MK is O(L2k), disregarding slight possible start-up and termination improvements, while that of ALG-BL is O(Lf2k+f), where k is the size of the signature register, f is the number of feedback taps, and L is the test sequence length. ALG-BL requires more shift and add operations, but requires half the number of floating-point multiplications that ALG-MK requires. The space complexity of ALG-MK is O(2k), while that of ALG-BL is O(2k+f ). It is also shown that ALG-MK and ALG-BL are formally related through a linear transformation of their state vectors. Both algorithms may be used to study aliasing under generalized error models
  • Keywords
    Markov processes; built-in self test; computational complexity; integrated circuit testing; iterative methods; logic testing; probability; ALG-MK; Markov process model; aliasing probabilities; compaction techniques; computational complexities; floating-point multiplications; iterative algorithm; shift/add operations; signature analysis; space complexity; time complexity; Automatic testing; Built-in self-test; Circuit testing; Compaction; Feedback; Iterative algorithms; Markov processes; Polynomials; Probability; Registers;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.68413
  • Filename
    68413