DocumentCode :
1394045
Title :
A fault model for PLAs
Author :
Ligthart, Michiel M. ; Stans, Rudi J.
Author_Institution :
Philips Res. Labs., Sunnyvale, CA, USA
Volume :
10
Issue :
2
fYear :
1991
fDate :
2/1/1991 12:00:00 AM
Firstpage :
265
Lastpage :
270
Abstract :
A fault model for programmable logic arrays (PLAs) is discussed. This model maps realistic failures on four classes of faults: multiple stuck-at faults, multiple bridging faults, multiple crosspoint faults, and faults due to breaks in lines. It is shown that multiple stuck-at faults are equivalent to multiple crosspoint faults, multiple bridging faults are sub-equivalent to multiple crosspoint faults, and the set of patterns detecting multiple crosspoint faults is a subset of the set of patterns detecting multiple bridging faults. Hence, the set of patterns detecting multiple crosspoint faults also detects all multiple stuck-at faults and multiple bridging faults. This reduces the fault model for PLAs to two classes: multiple missing/extra crosspoint faults and multiple breaks
Keywords :
fault location; logic arrays; logic testing; fault model; line breaks; multiple bridging faults; multiple crosspoint faults; multiple stuck-at faults; programmable logic arrays; Built-in self-test; Circuit faults; Computer errors; Decoding; Design automation; Error analysis; Fault detection; Laboratories; Logic testing; Programmable logic arrays;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.68414
Filename :
68414
Link To Document :
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