DocumentCode :
1394231
Title :
A 228 
W 750 MHz BPSK Demodulator Based on Injection Locking
Author :
Zhu, Qiang ; Xu, Yang
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Volume :
46
Issue :
2
fYear :
2011
Firstpage :
416
Lastpage :
423
Abstract :
An ultra-low-power BPSK demodulator based on injection locked oscillators (ILOs) is introduced in this paper. Two second harmonic ILOs are employed to convert BPSK signals to ASK signals, which are then demodulated by an envelope detector to baseband. For sub-GHz applications, the ILOs are implemented using ring oscillators to allow compact chip area and ultra-low power dissipation. Bit error rate (BER) analysis of this demodulator indicates erroneous polarity flipping of demodulated bits due to phase noise of ILO. The prototype chip is fabricated in a 65 nm CMOS technology that consumes 228 μW of power and occupies 0.014 mm2 of die area. Measurement results reveal the demodulation of 750 MHz 5 Mb/S differential BPSK signal with sensitivity of -43 dBm. Theoretical BER analysis has been verified with erroneous flipping observed in the measurement and its probability close to the prediction.
Keywords :
CMOS analogue integrated circuits; amplitude shift keying; demodulators; error statistics; harmonic oscillators (circuits); injection locked oscillators; low-power electronics; phase noise; phase shift keying; probability; ASK signals; BPSK signals; CMOS technology; bit error rate analysis; compact chip area; demodulated bits; demodulation; differential BPSK signal; envelope detector; erroneous polarity flipping; frequency 750 MHz; injection locked oscillators; injection locking; phase noise; power 228 muW; probability; prototype chip; ring oscillators; theoretical BER analysis; two second harmonic ILO; ultra-low power dissipation; ultra-low-power BPSK demodulator; CMOS analog integrated circuits; demodulators; injection locked oscillators; phase shift keying;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2090611
Filename :
5657273
Link To Document :
