• DocumentCode
    1394397
  • Title

    Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs

  • Author

    Velazco, Raoul ; Foucard, Gilles ; Peronnard, Paul

  • Author_Institution
    Lab. Tech. de l´´lnformatique et de la Microelectron. pour l´´Archit. des Syst. integres (TIMA), Grenoble, France
  • Volume
    57
  • Issue
    6
  • fYear
    2010
  • Firstpage
    3500
  • Lastpage
    3505
  • Abstract
    An approach combining the SRAM-based field-programmable gate array static cross-section with the results of fault injection campaigns allows predicting the error rate of any implemented application. Experimental results issued from heavy ion tests are compared with predictions to validate the proposed methodology.
  • Keywords
    SRAM chips; field programmable gate arrays; SRAM-Based FPGA; accelerated radiation tests; error rate; fault injection campaigns; field-programmable gate arrays; heavy ion tests; static cross-section; Fault tolerance; Field programmable gate arrays; Life estimation; Single event upset; Accelerated testing; fault injection; fault tolerance; field-programmable gate arrays (FPGAs); single-event rates; single-event upsets SEUs); space applications;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2087355
  • Filename
    5658002
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1394397