Title :
Investigation and Analysis of LM124 Bipolar Linear Circuitry Response Phenomenon in Pulsed X-Ray Environment
Author :
Roche, Nicolas J H ; Dusseau, L. ; Vaillé, J-R ; Mekki, J. ; Velo, Y. Gonzalez ; Perez, S. ; Boch, J. ; Saigné, F. ; Marec, R. ; Calvel, P. ; Bezerra, F. ; Auriel, G. ; Azaïs, B.
Author_Institution :
Univ. Montpellier II, Montpellier, France
Abstract :
Analog Transient Radiation Effects in Electronics (ATREE) induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in a LM124 operational amplifier configured in three different bias configurations are investigated. A predictive methodology, based upon a previously developed ASET simulation tool, is used to model the ATREE phenomena. A semiempirical physical model is used to perform the correlation between the duration of the parasitic pulse signal induced in the LM124 and an equivalent value of the high dose-rate X-ray pulse level.
Keywords :
X-ray apparatus; bipolar integrated circuits; dosimetry; radiation hardening (electronics); ASET simulation tool; ATREE; LM124 bipolar linear circuitry response phenomenon; LM124 operational amplifier; analog transient radiation effects in electronics; flash X-ray facility; high dose-rate X-ray pulse level; parasitic pulse signal; pulsed X-ray environment; semiempirical physical model; Analog integrated circuits; Integrated circuit modeling; Radiation effects; Single event transient; Transient response; Bipolar analog integrated circuits; integrated circuit modeling; ionizing dose; single event transient; transient propagation; transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2089063
