Title :
Statistical Techniques for Analyzing Process or “Similarity” Data in TID Hardness Assurance
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We investigate techniques for estimating the contributions to TID hardness variability for families of linear bipolar technologies, determining how part-to-part and lot-to-lot variability change for different part types in the process.
Keywords :
bipolar analogue integrated circuits; dosimetry; radiation hardening (electronics); statistical analysis; analyzing process; linear bipolar technologies; statistical techniques; total ionizing dose hardness effect; Quality assurance; Radiation effects; Reliability; Quality assurance; radiation effects; reliability estimation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2086480
